An Eye on Agilent Test & Measurement

September 15, 2010

Agilent Technologies Hosts Webcast on How to Verify the Data in LTE downlink signals

Filed under: LTE,Webcast — janetsmithagilent @ 9:48 pm

What:       The format of the LTE downlink RF signals are defined using a mixture of messages across several layers in the protocol stack, from the DCI to MIB and SIBs. This presentation shows in detail how some of the most important messages are built up, and how to verify step by step whether the signal you are dealing with is constructed according to the 3GPP Release 8 standard.  The presentation makes extensive use of the Agilent 89600 Vector Signal Analysis software application to show the link between protocol messages and the actual RF signals they control.

When:          September 28, 2010 / 10a.m.-11a.m. PT

Where:         Register Online or at: http://seminar2.techonline.com/s/agilent_sep2810

Additional Information:   www.agilent.com/find/lte

Advertisements

July 12, 2010

Agilent Technologies presents Webcast on Simplified Receiver Test of Retiming Architectures as USB3/SATA

Filed under: J-BERT,Serial ATA,Webcast — janetsmithagilent @ 4:39 pm
Tags: , ,

Many of today’s digital interface standards use 8B/10B coding and a concept of inserting or removing filler symbols (Aligns or Skip symbols) to compensate for different clock speeds within the system.

This webcast covers the basics of 8B/10B coding and data re-timing as these concepts are deployed in most common standards. It explains how such receivers are tested with Agilent’s latest J-BERT N4903B. Examples from SATA and USB 3.0 will be used to  illustrate the benefits of the new approach.

When:          Wednesday, July 28, 2010 10:00 a.m. PT / 1:00 p.m. ET

Where:         Register on line at:
http://www.home.agilent.com/agilent/redirector.jspx?action=ref&cname=AGILENT_EDITORIAL&ckey=1908692&cc=US&lc=eng&mcr=true&cmpid=36385

Additional Information: www.agilent.com/find/sata_rsg and  www.agilent.com/find/usb3_rx_test.

Backgrounders about USB and SATA technology and Agilent’s test solutions are available at www.agilent.com/find/usb_backgrounder and www.agilent.com/find/sata_backgrounder.

April 29, 2010

Agilent Technologies Offers Free LTE Design & Test Fundamental Webcast Series CDs

Filed under: LTE,Uncategorized,Webcast — janetsmithagilent @ 9:12 pm
Tags: ,

What:           The popular Agilent webcast series LTE Design & Test Fundamentals is available now in a two-volume set of CDs. Volume 1 includes five webcasts covering design & verification challenges, SC-FDMA, RF measurements for LTE, LTE protocol control and signaling, and more. Volume 2 includes seven webcasts covering MIMO, SDR, and the future of LTE Advanced.

Where:         www.agilent.com/find/lte-forward, registration is required to receive the CDs.

Additional Information: www.agilent.com/find/lte

April 16, 2010

Webcast on Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity

Filed under: Oscilloscopes,Webcast — janetsmithagilent @ 10:44 pm
Tags: ,

Agilent will host a webcast for all users and buyers of digital oscilloscopes, particularly those in education and basic research.   “Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity: How to Make the Most Accurate Digital Measurements” will show a counterintuitive concept: scopes with higher sample rates can exhibit poorer signal fidelity because of poorly aligned interleaved analog-to-digital converters (ADCs).

When:         May 05. 2010, 10:00 AM – 11:00 AM PT  /  1:00 PM – 2:00 PM ET

Where:         Online: Click here to register or

http://agilent.techonline.com/s/agilent_may0510

There is no charge for the webcast, registration is required.

Additional  Information: www.agilent.com/find/webcasts

Webcast on the Basics of De-Embedding and Embedding with Real-Time Oscilloscopes

Filed under: Signal Integrity,Webcast — janetsmithagilent @ 10:13 pm
Tags:

Today’s high-speed digital design engineers are faced with ever increasing data rates that create a multitude of challenges: interconnects become microwave transmission lines, reflections wreak havoc on timing margins and even the probes used to measure change the results. De-embedding is one of the most misused and misunderstood tools inside the signal integrity lab today. In this Webcast will cover the basics of de-embedding and embedding with a real time oscilloscope. Also included will be the considerations of modeling a system and obtaining the models for real circuits.

When:        April 29, 2010, 10:00 AM – 11:00 AM PT  /  1:00 PM – 2:00 PM ET

Where:         Online: Click here to register or http://seminar2.techonline.com/s/agilent_apr2910

Additional Information: www.agilent.com/find/si

February 27, 2010

Agilent Technologies’ Complimentary CDs offer Insight on Signal Integrity and Photonic Test

Filed under: Photonic Test,Signal Integrity,Webcast — janetsmithagilent @ 12:05 am
Tags: ,

What:    These complimentary CDs are packed with timely information to help overcome test challenges.

Digital Test: How to Master the High-Speed Test Challenge If you develop embedded designs, you face big challenges when it comes to characterizing forward-clocked memory, CPU interfaces and high-speed digital devices based on PCIe™2, USB, DisplayPort, HDMI and MIPI. Learn about the test requirements of your designs and get answers to your questions about compliance testing of next-generation multigigabit interfaces.

Photonic Test: Be Ready for 40/100G Optical Networks and Components Get ready for the transition to next-generation networking technology. This series of presentations covers test requirements for high-speed communication systems/components and advanced signal and modulation principles. Explore ways to test transients of reconfigurable network elements and measure the polarization and dispersion behavior of new component and network designs.

When:          Starting March 1, 2010, online

Where:    For further details and ordering:
www.agilent.com/find/webcastcds-dpt

For more information on Agilent’s series of webcast:
www.agilent.com/find/dptwebcasts

Additional information:   http://www.agilent.com/find/photonic and
http://www.agilent.com/find/si


February 17, 2010

Agilent Technologies presents Second Webcast on PCI Express® 3.0 Testing

Filed under: Webcast — janetsmithagilent @ 11:53 pm
Tags:

What:    Rick Eads, PCI Express Senior Program Manager at Agilent and member of the board of directors of the PCI SIG® and Yenyi Fu, Product Manager, Digital Debug Solutions at Agilent present “PCI Express® 3.0 Challenges & Agilent’s Test Solutions”.

This presentation will provide an overview of the latest developments in PCI Express 3.0 standards, some of the areas of the specification that would be key to consider for a successful PCI Express 3.0 design. This presentation will also highlight some of the test solutions provided by Agilent to help navigate the challenges in the PCI Express 3.0 specification, covering both the physical layer tests as well as protocol tools for functional and logical test and development.

When:          March 17, 2010, 10 am PST, One hour presentation

Where:    For further details and registration:   http://agilent.techonline.com/s/agilent_mar1710

For more information on the previous webcast in February: http://agilent.techonline.com/s/agilent_feb1710

Additional information:   www.agilent.com/find/pcie-express

February 5, 2010

Agilent Technologies presents Webcasts on SATA & SAS 6 Gb/s Physical and Protocol Layers Test

Filed under: Serial ATA,Webcast — janetsmithagilent @ 10:12 pm

What:           Min-Jie Chong, product manager for Agilent oscilloscopes business and program manager for storage (SATA/SAS) and mobile interface (MIPI) technology test solutions, and Matthew Hallberg, product manager at SerialTek, present “SATA & SAS 6Gb/s Physical and Protocol Layers Complete Test Solutions”.

This webcast will inform you about what do you need to know about designing and testing SATA and SAS products to ensure they work reliably and meet the standard specifications. In addition it provides details of Agilent’s industry leading SATA and SAS development and compliance test tools.

When:          February 24, 2010, 10 am PT, One hour presentation

Where:         For further details and registration:   http://agilent.techonline.com/s/agilent_feb2410 http://agilent.techonline.com/s/agilent_feb1710

Additional information:   www.agilent.com/find/sata

Agilent Technologies presents Webcasts on PCI Express® 3.0 Testing

Filed under: Webcast — janetsmithagilent @ 12:41 am
Tags:

Rick Eads, PCI Express Senior Program Manager at Agilent and member of the board of directors of the PCI SIG® and Yenyi Fu, Product Manager, Digital Debug Solutions at Agilent present “PCI Express® 3.0 Introduction & Key Design Challenges” on February 17, 2010, 10 am PT.

This presentation will provide an overview of the latest developments in PCI Express 3.0 standards, with a discussion of likely timeline and development schedules for the PCI-SIG specification development over the next 6 months. It focuses on some of the areas of the specification that would be key to consider for a successful PCI Express 3.0 design.

For further details and registration:   http://agilent.techonline.com/s/agilent_feb1710

For more information on an additional webcast on March 17, 2010: http://agilent.techonline.com/s/agilent_mar1710

Additional information

October 14, 2009

October 21 Webcast: ATE System Refresh / Upgrade…An Implementation “Monster.” Can it be “tamed”?

Filed under: Webcast — janetsmithagilent @ 5:13 pm

Date: October 21, 2009

Time: 12pm ET and 12pm PT

Duration: 1 hour

The passage-of-time will inevitably compromise a test system’s ability to provide decision-making information. Upgrades, enhancements, migration &/or modernization may be needed for new measurement capabilities, increased test speed, or to address test efficiency / maintenance / obsolescence issues. But how can the risks associated with software/test program set (TPS) migration and test system / process change be addressed?

 • What are the most-important ATE system refresh considerations?

• What are the options for addressing hardware obsolescence / upgrade?

• Can modernization be accomplished without system re-validation?

• If I can’t touch the Test Program Software, am I “stuck”? Can TPS re-certification be avoided?

• How can one best segment & prioritize such an implementation? Can I upgrade in “pieces”, or must it be done “all at once”? What is a ideal scenario?

• How may the opportunity cost-of-improvements be compared to the status quo?

• Can expected barriers-to-change be addressed? How?

• What are the risks of foregoing modernization? What are the probable benefits?

• What are typical ROIs? Which factors should be considered?

• Can the potential risks of migration be minimized while simultaneously maximizing test system performance / effectiveness? How?

• What is a typical effect of system modernization upon productivity?

ATE experts from both AGILENT and WINSOFT will share their knowledge, combined expertise and experience regarding these and other questions that many companies now face. Attendees will learn about developing & applying appropriate success factors to a well-conceived modernization program. Assessment of modernization barriers & benefits and business cycle considerations (that impact migration benefits and “drivers” of change) will be described. An approach that can leverage both technical & financial opportunities, minimize disruptions, and maximize test-system efficiency / performance & readiness will be described. Assessing financial & technical tradeoffs to create a realistic business case (sometimes with unexpected benefits) will also be discussed.

To register: visit this site.

Blog at WordPress.com.