What: The popular Agilent webcast series LTE Design & Test Fundamentals is available now in a two-volume set of CDs. Volume 1 includes five webcasts covering design & verification challenges, SC-FDMA, RF measurements for LTE, LTE protocol control and signaling, and more. Volume 2 includes seven webcasts covering MIMO, SDR, and the future of LTE Advanced.
Where: www.agilent.com/find/lte-forward, registration is required to receive the CDs.
Additional Information: www.agilent.com/find/lte
How does a company win a Test and Measurement World Best in Test award? And how does it win five Best in Test awards? The answer is technology leadership, and this is one “behind the scenes” story of an award winner.
Winner for the 2010 Best in Test product in the Bit-error-rate testers category, the Agilent J-BERT N4903B owes its success to early and in-depth collaboration with key customers, focusing on their’ leading-edge technological needs for high-speed digital buses used in computer chips. The J-BERT N4903B is a high-performance serial BERT that provides the most complete jitter tolerance test for embedded and forward clocked devices.
R&D engineers sought feedback on product requirements, placed prototypes at customer sites, and visited customers often to help them turn on and test chips while getting feedback during the design phase to optimize features and specifications. In addition, the team worked with standards bodies to understand and implement early requirements. Since its launch in February 2009, no other competitor product offers the value and capability of the J-BERT B and it continues to gain market visibility with awards from Electronic Products 2009 Product of the Year, EDN Hot 100 Electronic Products, finalist in the Design Vision award, and the Best in Test honor.
The Stimulus/Response Testing for LTE Components application note gives testing requirements and considerations for LTE components. It also provides test equipment setups, information on creation of LTE stimulus test signals for components, and analysis of LTE signals from components and transmitters.
Where: www.agilent.com/find/LTE-forward, registration is required to receive the application note.
Additional Information: www.agilent.com/find/lte
Agilent will host a webcast for all users and buyers of digital oscilloscopes, particularly those in education and basic research. “Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity: How to Make the Most Accurate Digital Measurements” will show a counterintuitive concept: scopes with higher sample rates can exhibit poorer signal fidelity because of poorly aligned interleaved analog-to-digital converters (ADCs).
When: May 05. 2010, 10:00 AM – 11:00 AM PT / 1:00 PM – 2:00 PM ET
Where: Online: Click here to register or
http://agilent.techonline.com/s/agilent_may0510
There is no charge for the webcast, registration is required.
Additional Information: www.agilent.com/find/webcasts
Agilent now offers a new solutions brochure that helps wireless engineers find the best I&M tools in the industry to test and monitor more cell sites in less time. This brochure also includes case studies, a product selection guide, and online resources. Also available is a new case study that describes how Agilent and Bryant Solutions helped solve GSM 850 interference and intermodulation issues between a wireless operator and a public safety agency.
Additional
Information: http://www.agilent.com/find/handheld
An Eye on Agilent Test & Measurement 