An Eye on Agilent Test & Measurement

April 29, 2010

Agilent Technologies Offers Free LTE Design & Test Fundamental Webcast Series CDs

Filed under: LTE,Uncategorized,Webcast — janetsmithagilent @ 9:12 pm
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What:           The popular Agilent webcast series LTE Design & Test Fundamentals is available now in a two-volume set of CDs. Volume 1 includes five webcasts covering design & verification challenges, SC-FDMA, RF measurements for LTE, LTE protocol control and signaling, and more. Volume 2 includes seven webcasts covering MIMO, SDR, and the future of LTE Advanced.

Where:         www.agilent.com/find/lte-forward, registration is required to receive the CDs.

Additional Information: www.agilent.com/find/lte

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April 26, 2010

Behind the scenes: J-BERT Best in Test award

Filed under: Awards,J-BERT,Uncategorized — janetsmithagilent @ 5:00 pm
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How does a company win a Test and Measurement World Best in Test award? And how does it win five Best in Test awards? The answer is technology leadership, and this is one “behind the scenes” story of an award winner.

Winner for the 2010 Best in Test product in the Bit-error-rate testers category, the Agilent J-BERT N4903B owes its success to early and in-depth collaboration with key customers, focusing on their’ leading-edge technological needs for high-speed digital buses used in computer chips. The J-BERT N4903B is a high-performance serial BERT that provides the most complete jitter tolerance test for embedded and forward clocked devices.

R&D engineers sought feedback on product requirements, placed prototypes at customer sites, and visited customers often to help them turn on and test chips while getting feedback during the design phase to optimize features and specifications. In addition, the team worked with standards bodies to understand and implement early requirements. Since its launch in February 2009, no other competitor product offers the value and capability of the J-BERT B and it continues to gain market visibility with awards from Electronic Products 2009 Product of the Year, EDN Hot 100 Electronic Products, finalist in the Design Vision award, and the Best in Test honor.

April 16, 2010

New Application Note on Stimulus Response Testing for LTE Components

Filed under: Application Notes,LTE — janetsmithagilent @ 10:50 pm
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The Stimulus/Response Testing for LTE Components application note gives testing requirements and considerations for LTE components.  It also provides test equipment setups, information on creation of LTE stimulus test signals for components, and analysis of LTE signals from components and transmitters.

Where:         www.agilent.com/find/LTE-forward, registration is required to receive the application note.

Additional Information: www.agilent.com/find/lte

Webcast on Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity

Filed under: Oscilloscopes,Webcast — janetsmithagilent @ 10:44 pm
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Agilent will host a webcast for all users and buyers of digital oscilloscopes, particularly those in education and basic research.   “Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity: How to Make the Most Accurate Digital Measurements” will show a counterintuitive concept: scopes with higher sample rates can exhibit poorer signal fidelity because of poorly aligned interleaved analog-to-digital converters (ADCs).

When:         May 05. 2010, 10:00 AM – 11:00 AM PT  /  1:00 PM – 2:00 PM ET

Where:         Online: Click here to register or

http://agilent.techonline.com/s/agilent_may0510

There is no charge for the webcast, registration is required.

Additional  Information: www.agilent.com/find/webcasts

Webcast on the Basics of De-Embedding and Embedding with Real-Time Oscilloscopes

Filed under: Signal Integrity,Webcast — janetsmithagilent @ 10:13 pm
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Today’s high-speed digital design engineers are faced with ever increasing data rates that create a multitude of challenges: interconnects become microwave transmission lines, reflections wreak havoc on timing margins and even the probes used to measure change the results. De-embedding is one of the most misused and misunderstood tools inside the signal integrity lab today. In this Webcast will cover the basics of de-embedding and embedding with a real time oscilloscope. Also included will be the considerations of modeling a system and obtaining the models for real circuits.

When:        April 29, 2010, 10:00 AM – 11:00 AM PT  /  1:00 PM – 2:00 PM ET

Where:         Online: Click here to register or http://seminar2.techonline.com/s/agilent_apr2910

Additional Information: www.agilent.com/find/si

New Solutions Brochure for Wireless Installation and Maintenance and a Wireless Interference Case Study

Agilent now offers a new solutions brochure that helps wireless engineers find the best I&M tools in the industry to test and monitor more cell sites in less time. This brochure also includes case studies, a product selection guide, and online resources. Also available is a new case study that describes how Agilent and Bryant Solutions helped solve GSM 850 interference and intermodulation issues between a wireless operator and a public safety agency.

Additional

Information:    http://www.agilent.com/find/handheld

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