An Eye on Agilent Test & Measurement

April 16, 2010

Webcast on the Basics of De-Embedding and Embedding with Real-Time Oscilloscopes

Filed under: Signal Integrity,Webcast — janetsmithagilent @ 10:13 pm
Tags:

Today’s high-speed digital design engineers are faced with ever increasing data rates that create a multitude of challenges: interconnects become microwave transmission lines, reflections wreak havoc on timing margins and even the probes used to measure change the results. De-embedding is one of the most misused and misunderstood tools inside the signal integrity lab today. In this Webcast will cover the basics of de-embedding and embedding with a real time oscilloscope. Also included will be the considerations of modeling a system and obtaining the models for real circuits.

When:        April 29, 2010, 10:00 AM – 11:00 AM PT  /  1:00 PM – 2:00 PM ET

Where:         Online: Click here to register or http://seminar2.techonline.com/s/agilent_apr2910

Additional Information: www.agilent.com/find/si

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February 27, 2010

Agilent Technologies’ Complimentary CDs offer Insight on Signal Integrity and Photonic Test

Filed under: Photonic Test,Signal Integrity,Webcast — janetsmithagilent @ 12:05 am
Tags: ,

What:    These complimentary CDs are packed with timely information to help overcome test challenges.

Digital Test: How to Master the High-Speed Test Challenge If you develop embedded designs, you face big challenges when it comes to characterizing forward-clocked memory, CPU interfaces and high-speed digital devices based on PCIe™2, USB, DisplayPort, HDMI and MIPI. Learn about the test requirements of your designs and get answers to your questions about compliance testing of next-generation multigigabit interfaces.

Photonic Test: Be Ready for 40/100G Optical Networks and Components Get ready for the transition to next-generation networking technology. This series of presentations covers test requirements for high-speed communication systems/components and advanced signal and modulation principles. Explore ways to test transients of reconfigurable network elements and measure the polarization and dispersion behavior of new component and network designs.

When:          Starting March 1, 2010, online

Where:    For further details and ordering:
www.agilent.com/find/webcastcds-dpt

For more information on Agilent’s series of webcast:
www.agilent.com/find/dptwebcasts

Additional information:   http://www.agilent.com/find/photonic and
http://www.agilent.com/find/si


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