An Eye on Agilent Test & Measurement

July 29, 2009

Microwave Microscopy Mode wins R&D 100 Award

Filed under: Awards,Microwave Microscopy Mode — janetsmithagilent @ 10:40 pm

Demonstrating the synergy between an acquired business (atomic force microscopes) and an existing core competency (network analyzers), Agilent’s scanning microwave microscopy mode has been named one of 2009’s most innovative products by R&D magazine. The R&D 100 Awards are among the most prestigious in the high-tech industry.


July 28, 2009

Digital Multimeter Application Notes

Filed under: Application Notes,DMMs — janetsmithagilent @ 12:53 pm
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Three new app notes are now available from Agilent:

1) On Improving Digital Multimeter Throughput

This application note describes how to make a modern digital multimeter operate at its absolute fastest transaction speed. It includes tips on reducing range and function changes, proper auto-zero operation, selecting optimal integration times and using best data formats. The application note is written to address the needs of engineers in R&D, design verification and manufacturing.

2) On Improving AC Measurements Using Digital Multimeters

Some modern digital multimeters employ a Sigma/Delta A-to-D converter technique. Sigma/Delta is a digital sampling technique that opens the possibility of very fast and accurate AC measurements, even in the presence of high crest factors. This application note outlines some of the advantages of this new digital sampling technique, from making peak AC measurements at up to 50,000 times per second to easily measuring AC ripple on a DC supply output.

3) On Data Logging and Digitizing Using a Digital Multimeter

Logging data is a common use for digital multimeters (DMMs). Some DMMs make this process easier by having a dedicated data logger function with simplified setup and operation. The availability of LAN I/O on modern DMMs makes remote data logging easier than ever. Some modern digital multimeters also make very fast measurements at up to 50,000 readings per second. When combined with level trigger, pre- and post-trigger and large memory, it is possible to acquire and digitize signals up to the mid-audio region. This application note for use by engineers in R&D, design verification and manufacturing describes how to take advantage of these data logging capabilities.

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