An Eye on Agilent Test & Measurement

February 17, 2010

Agilent Technologies presents Second Webcast on PCI Express® 3.0 Testing

Filed under: Webcast — janetsmithagilent @ 11:53 pm
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What:    Rick Eads, PCI Express Senior Program Manager at Agilent and member of the board of directors of the PCI SIG® and Yenyi Fu, Product Manager, Digital Debug Solutions at Agilent present “PCI Express® 3.0 Challenges & Agilent’s Test Solutions”.

This presentation will provide an overview of the latest developments in PCI Express 3.0 standards, some of the areas of the specification that would be key to consider for a successful PCI Express 3.0 design. This presentation will also highlight some of the test solutions provided by Agilent to help navigate the challenges in the PCI Express 3.0 specification, covering both the physical layer tests as well as protocol tools for functional and logical test and development.

When:          March 17, 2010, 10 am PST, One hour presentation

Where:    For further details and registration:   http://agilent.techonline.com/s/agilent_mar1710

For more information on the previous webcast in February: http://agilent.techonline.com/s/agilent_feb1710

Additional information:   www.agilent.com/find/pcie-express

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