An Eye on Agilent Test & Measurement

February 5, 2010

Agilent Technologies presents Webcasts on PCI Express® 3.0 Testing

Filed under: Webcast — janetsmithagilent @ 12:41 am
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Rick Eads, PCI Express Senior Program Manager at Agilent and member of the board of directors of the PCI SIG® and Yenyi Fu, Product Manager, Digital Debug Solutions at Agilent present “PCI Express® 3.0 Introduction & Key Design Challenges” on February 17, 2010, 10 am PT.

This presentation will provide an overview of the latest developments in PCI Express 3.0 standards, with a discussion of likely timeline and development schedules for the PCI-SIG specification development over the next 6 months. It focuses on some of the areas of the specification that would be key to consider for a successful PCI Express 3.0 design.

For further details and registration:   http://agilent.techonline.com/s/agilent_feb1710

For more information on an additional webcast on March 17, 2010: http://agilent.techonline.com/s/agilent_mar1710

Additional information

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