What: These complimentary CDs are packed with timely information to help overcome test challenges.
Digital Test: How to Master the High-Speed Test Challenge If you develop embedded designs, you face big challenges when it comes to characterizing forward-clocked memory, CPU interfaces and high-speed digital devices based on PCIe™2, USB, DisplayPort, HDMI and MIPI. Learn about the test requirements of your designs and get answers to your questions about compliance testing of next-generation multigigabit interfaces.
Photonic Test: Be Ready for 40/100G Optical Networks and Components Get ready for the transition to next-generation networking technology. This series of presentations covers test requirements for high-speed communication systems/components and advanced signal and modulation principles. Explore ways to test transients of reconfigurable network elements and measure the polarization and dispersion behavior of new component and network designs.
When: Starting March 1, 2010, online
Where: For further details and ordering:
www.agilent.com/find/webcastcds-dpt
For more information on Agilent’s series of webcast:
www.agilent.com/find/dptwebcasts
Additional information: http://www.agilent.com/find/photonic and
http://www.agilent.com/find/si
An Eye on Agilent Test & Measurement 